X-ray study of structural domains in the near-surface region of SrTiO3 substrates with Y0.6Pr0.4Ba2Cu3O7 ÕLa2Õ3Ca1Õ3MnO3 superlattices grown on top

نویسندگان

  • J. Hoppler
  • J. Stahn
  • H. Bouyanfif
  • V. K. Malik
  • B. D. Patterson
  • P. R. Willmott
  • G. Cristiani
  • H.-U. Habermeier
چکیده

J. Hoppler,1,2,* J. Stahn,2 H. Bouyanfif,1,† V. K. Malik,1 B. D. Patterson,3 P. R. Willmott,3 G. Cristiani,4 H.-U. Habermeier,4 and C. Bernhard1 1Department of Physics and Fribourg Center for Nanomaterials, University of Fribourg, Chemin du Musée 3, CH-1700 Fribourg, Switzerland 2Laboratory for Neutron Scattering, ETH Zurich & Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland 3Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland 4Max-Plank-Institut für Festkörperforschung Stuttgart, D-70569 Stuttgart, Germany

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

In situ X-ray diffraction and the evolution of polarization during the growth of ferroelectric superlattices

In epitaxially strained ferroelectric thin films and superlattices, the ferroelectric transition temperature can lie above the growth temperature. Ferroelectric polarization and domains should then evolve during the growth of a sample, and electrostatic boundary conditions may play an important role. In this work, ferroelectric domains, surface termination, average lattice parameter and bilayer...

متن کامل

Enhanced Physical Properties Of Indium Tin Oxide Films Grown on Zinc Oxide-Coated Substrates

Structural, electrical and optical properties of indium tin oxide or ITO (In2O3:SnO2) thin films on different substrates are investigated. A 100-nm-thick pre-deposited zinc oxide (ZnO) buffer layer is utilized to simultaneously improve the electrical and optical properties of ITO films. High purity ZnO and ITO layers are deposited with a radio frequency sputtering in argon ambient with plasma p...

متن کامل

Thermal Oxidation Times Effect on Structural and Morphological Properties of Molybdenum Oxide Thin Films Grown on Quartz Substrates

Molybdenum oxide (α-MoO)thin films were prepared on quartz and silicon substrates by thermal oxidation of Mo thin films deposited using DC magnetron sputtering method. The influence of thermal oxidation times ranging from 60-240 min on the structural and morphological properties of the preparedfilms was investigated using X-ray diffraction, Atomic force microscopy and Fourier transform infrared...

متن کامل

Morphological, structural and photoresponse characterization of ZnO nanostructure films deposited on plasma etched silicon substrates

ZnO nanostructure films were deposited by radio frequency (RF) magnetron sputtering on etched silicon (100) substrates using dry Ar/SF6 plasma, at two etching times of 5 min and 30 min, and on non etched silicon surface. Energy dispersive X-ray (EDX) technique was employed to investigate the elements contents for etched substrates as well as ZnO films, where it is found to be stoichiometric. Su...

متن کامل

Thin Pt films on the polar SrTiO3(111) surface : an experimental and theoretical study

We have examined the growth of thin Pt films on the polar SrTiO3(111) surface using both experimental and theoretical methods. Pt films were grown on both as-received and treated substrates in a UHV chamber using electron beam evaporation, and they were characterized with x-ray and low-energy electron diffraction and atomic force microscopy. The nature of the substrate surface strongly influenc...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2008